[Dataray] UV, GR, IR Focus Beam Profiler
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안녕하십니까, 라이트런(주) 입니다.
Dataray사의 UV, GR, IR Focus beam profiler 데모 가능합니다.
제품의 주요 특징은 아래와 같으며, PRODUCTS 게시판에서도 확인하실 수 있습니다.
데모를 희망하실 경우에는, 메일 및 카카오톡으로 연락 부탁드리겠습니다.
(E-mail: sales@lightrun.co.kr / support@lightrun.co.kr)
High Resolution Focus Imaging – High Damage Threshold (Up to 1* kW)
The Industrial Laser Monitoring System (ILMS) is designed for profiling focused, high-power industrial lasers. This system combines reimaging/magnification optics, a polarization preserving beam sampler, and a DataRay beam profiler to measure small beam waists which would otherwise damage a traditional profiling system. Magnification of the focused beam allows full pixel-by-pixel 2D measurements of beam spots as small as a few microns.
The ILMS is compatible with most DataRay profilers and supported by the full-featured, highly customizable, and user-centric software (included without licensing fees). The software automatically accounts for the magnification of the system, so results do not require post-processing or corrections.
Key Features
- - Options from 190 nm up to 16 μm
- - Beam waist diameters down to a few μm
- - High magnification options available (50X and beyond)
- - High-power beams (handling up to kWs)
- - Three swappable filters for flexible, fine attenuation
- - Profiler easily removed from system for stand-alone use
- - Optional calibrated pinhole apertures
- - Integrated power meter and beam dumps available
- - Available without beam sampler for focused, low power beams
- - Integrated power meter options
Example Applications
- - Tightly focused beams, fiber ends, edge couplers, laser diodes, and more
- - High-power laser cutting systems
- - Additive manufacturing
- - Quality control
- 이전글[Dataray] CO2, IR, GR, UV Beam Profiler 24.10.23
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