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[DataRay] BeamMap2 / BeamMap2 Collimate > MEASUREMENT

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PRODUCTS MEASUREMENT

MEASUREMENT

BEAM PROFILER [DataRay] BeamMap2 / BeamMap2 Collimate

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댓글 0건 조회 259회 작성일 24-08-05 10:21

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Manufacturer DATARAY
Country of Origin USA
Model BeamMap2 / BeamMap2 Collimate
Features See below

제품설명

라이트런에서 DataRay의 Beam profiler (빔 프로파일러) 제품을 공급하고 있습니다.
제품에 대한 자세한 설명 및 사양은 아래 내용을 참고하시거나, 라이트런으로 문의 바랍니다.
(DataRay Beam profiler (BeamMap2 / BeamMap2 Collimate) is supplied by Lightrun. For detailed product descriptions and specifications, please refer to the information below or contact Lightun for further inquiries.)


Real-time focus finding with instant M²

DataRay’s BeamMap2 represents a radically different approach to real-time beam profiling. It extends the Beam'R2’s measurement capabilities by allowing for measurements at multiple locations along the beam’s travel. This real-time scanning slit system uses XY slit pairs in multiple Z planes on a rotating puck to simultaneously measure four beam profiles at four different Z locations. The BeamMap2’s unique design is most advantageous for real-time measurement of focus position, M², beam divergence, and pointing.


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Key Features

• Multiple detector options covering 190 to 2500 nm

190 to 1150 nm, Silicon detector

650 to 1800 nm, InGaAs detector

1800 to 2300/2500 nm, InGaAs (extended) detector

• ISO compliant beam diameter measurements

• Port-powered USB 2.0

• Auto-gain function

• Optional stage accessory for ISO 11146- compliant M² measurements

• True2D™ slits

• Resolution to 0.1 µm

• 5 Hz update rate (adjustable 2 to 10 Hz)

• Profile CW/Quasi-CW beams

• Beam diameters 5 µm to 4 mm

• Multiple z-plane scanning

• XYZ profiles, plus θ-Φ

• Focus position and diameter

• Real-time M², pointing, and divergence measurements

• Identify focus with ±1 µm repeatability (beam dependent)



Example Applications

• Very small laser beam profiling

• Optical assembly and instrument alignment

• OEM integration

• Lens focal length testing

• Real-time diagnosis of focusing and alignment errors

• Real-time setting of multiple assemblies to the same focus

• M² measurement with available M2DU stage



True2D™ Slits

• 0.4 µm thick metallic multilayer films on a sapphire substrate

• Mutliple advantages over air slits

Avoid tunnel effect

Air slits are typically deeper than they are wide, and can buckle under high irradiance


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